Automatic I/O Testing System with High speed
Outline / Feature
- Todays high pin count devices make it increasingly difficult for OPEN/SHORT testing. FB102-0 offers an ideal HIGH SPEED solution with EASY OPERATION.
- High speed OPEN/SHORT testing in 3msec/pin
- Upgrade from 256 to 4096 pin, in 128 pin steps
- Pass/Fail judgement by comparing curves of passed and failed devices on the same screen
- Accurate testing by a choice of each Current range for Source and Sink, even with a single diode
- Powered Curve Tracer function
- Leak test function for input pin
- Data stored in CSV format